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  The Co-Organizers list is provisional and updated on June 25th , 2020. Others Co-organizers will be added, accordingly to the progress of event organization.

NanoMEGAS SPRL


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NanoMEGAS SPRL
Blvd Edmond Machtens, 79
B-1080 Brussels, BELGIUM
Tel. +32 (0)2 346 56 37
Fax +32 (0) 2 647 47 60


Sito Web: www.nanomegas.com
Contact person: Thanos GALANIS
E-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.


NanoMEGAS (www.nanomegas.com) founded in Brussels in 2004, is a world leader SME in the development and commercialization of unique transmission electron microscopy (TEM) accessories for several scientific / industrial applications based on precession electron diffraction. NanoMEGAS was the first company to develop and commercialize Precession Electron Diffraction (PED) equipment that is compatible for almost all type of commercial TEM and has been installed in more than 150 laboratories all over the world. Based on PED method that consist a breakthrough in electron diffraction, various applications have been developed. Electron crystallography has been considered as an alternative powerful tool for the structure analysis of crystals of few nm size and many important materials and compounds have been analyzed. In 2008 in collaboration with CNRS-INP Grenoble-France (common Patent) the Automated Phase-Orientation Mapping application, called “ASTAR”, has been launched which allows 1-5 nm resolution maps (EBSD like) for any material (for FEG-TEM). ASTAR received the “Microscopy Today 2011 Innovation Award” during M&M 2011 Congress in USA. NanoMEGAS has also developed, in collaboration with NanoMEGAS USA, a Strain Analysis method using TEM that provides results with high strain sensitivity (up to 0.02% of strain) and spatial resolution (up to 1-5 nm when FEG-TEM is used). In September 2015 NanoMEGAS was proudly announced a novel solution in collaboration with Columbia University, for the analysis of amorphous materials using the electron Pair Distribution Function (ePDF) algorithm specifically prepared for data obtained by TEM, reducing dramatically the acquisition time compared to conventional x-ray techniques.

Due to the large number of NanoMEGAS devices and applications installed worldwide, the scientific production on Electron Diffraction applications has been exponentially increased since 2004 with high lever peer reviewed published articles.


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