Taking multimodal materials characterization
further with plasma FIB-SEM
September 16th, 2020
Faculty of Civil and Industrial Engineering - Sapienza University of Rome
Plasma FIB-SEM technology is continously advancing and expanding the opportunities we have to caracterize materials in unique and powerful ways overcoming the challenges of materials characterisation faced using the traditional GaFIB-SEM solutions. Althoug these are very powerful instruments the Plasma FIB mitigates or eliminates some of the GaFIB tipical limitations expanding even further the opportunities to use these powerful instruments for materials characterisation.
The plasma FIB-SEM allows to explore large cross-sections and large volumes, which is important and sometimes essential, in order to obtain statistically reliable measurements of materials. Moreover the sample damage is minimized and gallium contamination is eliminated and, because there are great integrating capabilities into the current FIB-SEM platform, it is really possible to make the FIB-SEM a versatile nanoscale laboratory for multimodal/multiscale characterization.
Dr. Dean Miller – Senior Scientist TESCAN