New AFM Nanoelectrical Capability
September 17th, 2020
Faculty of Civil and Industrial Engineering - Sapienza University of Rome
Functional Imaging with Higher-Dimensional Electrical Data Sets
AFM-based nanoelectrical modes have numerous applications in fields ranging from semiconductors to biology. The data produced have traditionally been in the form of a 2D map, generated in contact mode, with a single electrical data point per XY location. Electrical ramps or spectra would be generated at a few, carefully selected locations. A new approach to nanoelectrical imaging that creates an electrical data cube and a correlated nanomechanical data cube while operating at normal imaging speeds will be discussed: it avoids contact mode imaging, thus extending electrical measurements to soft and fragile samples and improving measurement consistency. Moreover, this is a general approach that is applicable to most nanoelectrical modes and applications.
Dr. Mickael Febvre – EMEA-LAM application manager