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  The Co-Organizers list is provisional and updated on March 12th , 2020. Others Co-organizers will be added, accordingly to the progress of event organization.

SPM School

It is with the greatest pleasure that we announce the NanoInnovation School on Scanning Probe Microscopy (SPM), which will be held as a satellite event of NanoInnovation 2020. After the success of the school on electron microscopy during the past edition of NanoInnovation, the topic of the this year school will be focused on the most recent SPM techniques, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), scanning near field optical microscopy (SNOM) and other scanning probe methods, for advanced functional characterization (electric, magnetic, mechanical, chemical…) of materials at the nanometer scale.

The NanoInnovation 2020 SPM School is mainly intended for  graduate and PhD students as well as young scientists interested in deepening their knowledge about advanced SPM methods, but it is also open to all researchers and scientists who are involved in the different fields characterizations methods for nanotechnology and nanosciences.

As for all the NanoInnovation events, the attendance to the NanoInnovation 2020 SPM School is free and the interested attendees are requested to register using the NanoInnovation website selecting the option “SPM School” in the online form. 


THE PRELIMINARY LIST OF TOPICS AND SPEAKERS
PASSERI Daniele 2020

Daniele PASSERI, Chair
University of Rome Sapienza

INVITED SPEAKERS AND TOPICS

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Gunjan AGARWAL

  • Application of MFM for bio-nanotechnology
 
ALBONETTI

Cristiano ALBONETTI

  • (title in definition)
 
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Agustina ASENJO

  • Characterization of nanomagnets by Advanced Magnetic Force Microcopy
 
BALDASSARRI Leonetta

Leonetta BALDASSARRE

  • (title in definition)
 
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Fabrizio BOBBA

  • Scanning tunneling microscopy (title in definition)
 
CELANO Umberto

Umberto CELANO

  • SCM and SSRM application in Nanoelectronics (carrier profiling)
  • C-AFM for high-k and 2D materials
  • 3D tomographic AFM using Scalpel SPM
 
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Ricardo GARCIA

  • Multimodal AFM (title in definition) 
 
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Samuel JARVIS

  • Atomically Precise Molecular Design: Insights From Sub-molecular Resolution Scanning Probe Microscopy 
 
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Oleg KOLOSOV

  • Exploration of nanoscale thermal transport and thermoelectric phenomena in 2D materials via scanning probes
  • Nanoscale 3D imaging of physical properties of materials
 
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Francesco MARINELLO

  • Data analysis in SPM (title in definition)
 
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Bernard NYSTEN

  • MFM and PFM characterisation of ferromagnetic, ferroelectric and multiferroic nanostructures
 
SIKORA Andrzej
Andrzej SIKORA
Wroclaw University of  Science and Technology (Wroclaw, POLAND)
 
  • The utilization of fast AFM’s tip-sample interaction for the surface morphology imaging and mechanical properties mapping.
  • Correlative microscopy – the issue of precise positioning of the sample and its impact on the experiment outcome.
 
 
 
ORGANIZERS

 

AIRI

 

Associazione NanoItaly 300

 

SCIENTIFIC PATRONAGES

IMASS

SIA mio

SIA mio

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INSTITUTIONAL PATRONAGES



Ministero della Difesa

Ministero della Salute scritta

 Ministero Sviluppo Economico

Ministero MIPAAF 

 

INSTITUTIONAL PARTNERS



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IN COOPERATION WITH

 

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